Optical Characterization of laterally and vertically structured oxides and semiconductors
Conference Paper
(2014)
Author(s)
P Petrik (TU Delft - ImPhys/Optics)
N Kumar (TU Delft - ImPhys/Optics)
E Agocs (External organisation)
B Fodor (External organisation)
Silvania Pereira (TU Delft - ImPhys/Optics)
T Lohner (External organisation)
Mi Fried (External organisation)
Paul Urbach (TU Delft - ImPhys/Optics)
Research Group
ImPhys/Optics
To reference this document use:
https://resolver.tudelft.nl/uuid:e8e6d9b8-36ba-4614-9609-360cd5da27dd
More Info
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Publication Year
2014
Language
English
Research Group
ImPhys/Optics
Bibliographical Note
89870E-1 - 89870E-10@en
Pages (from-to)
1-10
ISBN (print)
9780819499004
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