29 records found
1
Methods for optical modeling and cross-checking in ellipsometry and scatterometry
Investigation of terahertz emission from BiVO4/ Au thin film interface
Thickness dependent terahertz emission from cobalt thin films
Electric field, Magnetic field and Magnetization: THz Time-Domain Spectroscopy Studies
Fourier ellipsometry: an ellipsometric approach to Fourier scatterometry
Emission of terahertz pulses from nanostructured metal surfaces
Optical Characterization of laterally and vertically structured oxides and semiconductors
Coherent Fourier Scatterometry
Towards Grating Reconstruction in Coherent Fourier Scatterometry
Recontruction of sub-wavelength features and nano-positioning of gratings using coherent Fourier Scatterometry.
Application of micro solid immersion lens as probe for near-field scanning microscopy
Plasmon-enhanced terahertz emission from a semiconductor/metal interface
Measurement comparison of goniometric scatterometry and coherent Fourier scatterometry.
Demonstration of an optimised focal field with long focal depth and high transmission obtained with the Extended Nijboer-Zernike theory
Experimental and numerical analysis of the super resolution near-field effect on an InSb sample
Phase information in Coherent Fourier Scatterometry
Lowering the Cross Correlation between Different Shape Parameters of the Inverse Grating Problem in Coherent Fourier Scatterometry¿
Phase retrieval between overlapping orders in coherent Fourier scatterometry using scanning
Interferometric coherent Fourier scatterometry: a method for obtaining high sensitivity in the optical inverse-grating problem
Enhanced terahertz emission by coherent optical absorption in ultrathin semiconductor films on metals