Isolation and characterization of few-layer black

Journal article (2014)

Authors

A. Castellanos Gomez QN/Mol. Electronics & Devices
L. Vicarelli QN/High Resolution Electron Microscopy
H.W. Zandbergen QN/High Resolution Electron Microscopy
JJ Palacios External organisation
H.S.J. van der Zant QN/Mol. Electronics & Devices
E Prada External organisation
J.O. Island QN/Mol. Electronics & Devices
KL Narashima-Acharya External organisation
SI Blanter External organisation
DJ Groenendijk External organisation
M. Buscema QN/Mol. Electronics & Devices
G.A. Steele QN/Mol. Electronics & Devices
JV Alvarez External organisation
Research Group
QN/Mol. Electronics & Devices
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Published Date

2014

Language

English

Reuse Rights

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Research Group

QN/Mol. Electronics & Devices