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Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs
Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs
Investigation on Transient Failure Mode of Asymmetric Trench Gate SiC MOSFET Under Single-Pulse Avalanche Stress
LES-based numerical analysis of surface-pressure fluctuations and unsteady thrust of a marine propeller
Intrinsic self-healing of polymer solid while keeping integrity and load-bearing capability
Mechanical Characterization of III-V Nanowire Using Molecular Dynamics Simulation
The chemical-mechanical relationship of the SiOC(H) dielectric film
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