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Announcing TU Delft Repository replacement
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2 July 2024
TU Delft Repository will be replaced with a fresh user friendly design with monthly new feature releases.
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Searched for: contributor%3A%22Urbach%2C+H.P.+%28promotor%29%22
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Sub-wavelength metrology using Coherent Fourier Scatterometry
Coherent fourier scatterometry
Silicon photonic micro-ring resonators to sense strain and ultrasound
Adaptive Optics for EUV Lithography: Phase Retrieval for Wavefront Metrology
On super resolved spots in the near-field regime
Rigorous simulations of emitting and non-emitting nano-optical structures
The Extended Nijboer-Zernike Diffraction Theory and its Applications
Ray-optics analysis of inhomogeneous optically anisotropic media
A systematic analysis of the optical merit function landscape: Towards improved optimization methods in optical design
Diffractive Optics of Anisotropic Polarization Gratings
An analytic approach to electromagnetic scattering problems
Mark formation model for optical rewritable recording
Three dimensional rigorous model for optical scattering problems
Searched for: contributor%3A%22Urbach%2C+H.P.+%28promotor%29%22
(1 - 13 of 13)
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