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Searched for: subject%3A%22microscopy%22
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Deep sub-wavelength metrology for advanced defect classification
Enhancing re-detection efficacy of defects on blank wafers using stealth fiducial markers
Helium ion beam induced growth of hammerhead AFM probes
Nanofabrication with a helium ion microscope
Nanofabrication with a helium ion microscope
Structured illumination microscopy using extraordinary transmission through sub-wavelength hole-arrays
Measuring the near-field of extra-ordinary transmission through a periodic hole-array
A novel concept for a mid-field microscope
Toward the development of a Three-Dimensional Mid–Field Microscope
Searched for: subject%3A%22microscopy%22
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