AK
A. Keyvani Janbahan
13 records found
1
Authored
The real-time and accurate measurement of tip-sample interaction forces in Tapping Mode Atomic Force Microscopy (TM-AFM) is a remaining challenge. This obstruction fundamentally stems from the causality of the physical systems. Since i) the input of the dynamic systems propagates
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Many investigations have focused on steady-state nonlinear dynamics of cantilevers in tapping mode atomic force microscopy (TM-AFM). However, a transient dynamic model—which is essential for a model-based control design—is still missing. In this paper, we derive a mathematical ...
The technique of Atomic Force Microscopy (AFM) is one of the major inventions of the twentieth century which substantially contributed to our understanding of the nanoscale world. In contrast to other microscopy techniques, the AFM does not operate based on the electromagnetic wa
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The origin of amplitude reduction in Tapping Mode Atomic Force Microscopy (TM-AFM) is typically attributed to the shift in resonance frequency of the cantilever due to the nonlinear tip-sample interactions. In this paper, we present a different insight into the same problem which
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Chaos
The speed limiting phenomenon in dynamic atomic force microscopy
This paper investigates the closed-loop dynamics of the Tapping Mode Atomic Force Microscopy using a new mathematical model based on the averaging method in Cartesian coordinates. Experimental and numerical observations show that the emergence of chaos in conventional tapping mod
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Due to the harmonic motion of the cantilever in Tapping Mode Atomic Force Microscopy, it is seemingly impossible to estimate the tip-sample interactions from the motion of the cantilever. Not directly observing the interaction force, it is possible to damage the surface or the ti
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The maximum amount of repulsive force applied to the surface plays a very important role in damage of tip or sample in Atomic Force Microscopy(AFM). So far, many investigations have focused on peak repulsive forces in tapping mode AFM in steady state conditions. However, it is kn
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Contributed
High performance machines such as those used in the semiconductor industry, robotics or racing engines have lots of fast moving parts. The dynamic properties of these moving parts are crucial to the performance of the machine. Therefore these moving parts have to be carefully des
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High performance machines such as those used in the semiconductor industry, robotics or racing engines have lots of fast moving parts. The dynamic properties of these moving parts are crucial to the performance of the machine. Therefore these moving parts have to be carefully des
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In recent years the Tapping Mode-Atomic Force Microscope (TM-AFM) has become one of the most important tools for imaging on the nanometer scale. In comparison with other contemporary technologies, the AFMs have been able to obtain atomic resolution both in high vacuum and li ...