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T Noda
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2 records found
Aerial image based lens metrology for wafer steppers.
Journal article -
P. Dirksen
,
J.J.M. Braat
,
AJEM Janssen
,
A Leeuwestein
,
T Matsuyama
,
T Noda
Terahertz linear and nonlinear dynamics in confined magnetoexcitons
Journal article -
J Kono
,
MY Su
,
M Sundaram
,
AC Gossard
,
KB Nordstrom
,
J Cerne
,
MS Sherwin
,
SJ Allen
,
T Inoshita
,
T Noda
,
H Sakaki
,
G.E. Bauer