Trends in tests and failure mechanisms in deep sub-micron technologies
Conference Paper
(2006)
Author(s)
Said Hamdioui (TU Delft - Computer Engineering)
Zaid Al-Ars (TU Delft - Computer Engineering)
L Mhamdi (TU Delft - Computer Engineering)
G. N. Gaydadjiev (TU Delft - Computer Engineering)
S Vassiliadis (TU Delft - Computer Engineering)
Research Group
Computer Engineering
To reference this document use:
https://resolver.tudelft.nl/uuid:26f529cb-a34b-43a1-8ce1-41e7649669f7
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Publication Year
2006
Research Group
Computer Engineering
Pages (from-to)
216-221
ISBN (print)
0-7803-9726-6
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