European Test Symposium Teams
an Anniversary Snapshot
M. Jenihhin (Tallinn University of Technology)
Jaan Raik (Tallinn University of Technology)
A. Jutman (Tallinn University of Technology)
S.A.M. Mir (Université Grenoble Alpes, TU Delft - Software Engineering)
M. Taouil (TU Delft - Computer Engineering)
M. Fieback (TU Delft - Computer Engineering)
R.K. Bishnoi (TU Delft - Computer Engineering)
S. Hamdioui (TU Delft - Computer Engineering)
K. Ma (Rebellions AI, TU Delft - EKL-Users)
More authors (External organisation)
More Info
expand_more
Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.
Abstract
The IEEE European Test Symposium (ETS) has been facilitating progress in electronic systems testing since its launch in 1996. On the occasion of its 30th anniversary, this collaborative paper gathers sections by 21 ETS teams to outline their influential ideas and milestones. Each team's section highlights historical perspective, current research, frameworks and projects as well as forward-looking research agendas in the area of electronic-based circuits and systems testing, reliability, safety, security and validation. This anniversary summary documents how research of various ETS teams, exemplifying the test community, has been evolving and transitioning from concepts to practical standards and Electronic Design Automation (EDA) tools and flows. This legacy is a strong base to drive the next generation of advances in electronic systems testing.