Online Detection of Unique Faults in RRAMs
Hanzhi Xun (TU Delft - Computer Engineering)
M. Fieback (TU Delft - Computer Engineering)
Mohammad Amin Yaldagard (TU Delft - Computer Engineering)
Sicong Yuan (TU Delft - Computer Engineering)
H. Aziza (Aix Marseille Université)
M. Taouil (TU Delft - Computer Engineering)
Said Hamdioui (TU Delft - Computer Engineering)
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Abstract
Due to the immature manufacturing process, Resistive Random Access Memories (RRAMs) are prone to exhibit new failure mechanisms and faults, which should be efficiently detected for high-volume production. Those unique faults are hard to detect but require specific Design-for-Test (DfT) circuit design. This paper proposes a DfT based on a parallel-reference write circuit that can detect all RRAM array faults during diagnosis, production testing, and its application in the field.