Prognostic Monitoring of Power QFN Packages with Silver Sintered Die-Attach Materials

Journal Article (2024)
Author(s)

H.A. Martin (TU Delft - Electronic Components, Technology and Materials, Chip Integration Technology Center)

Dong Hu (TU Delft - Electronic Components, Technology and Materials)

X. Liu (Nexperia B.V., TU Delft - Electronic Components, Technology and Materials)

R.H. Poelma (Nexperia B.V., TU Delft - Electronic Components, Technology and Materials)

Edsger C.P. Smits (Chip Integration Technology Center (CITC))

Willem van Driel (Signify, TU Delft - Electronic Components, Technology and Materials)

G. Zhang (TU Delft - Electronic Components, Technology and Materials)

Research Group
Electronic Components, Technology and Materials
DOI related publication
https://doi.org/10.1109/TCPMT.2024.3443530
More Info
expand_more
Publication Year
2024
Language
English
Related content
Research Group
Electronic Components, Technology and Materials
Bibliographical Note
Green Open Access added to TU Delft Institutional Repository 'You share, we take care!' - Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.@en
Issue number
12
Volume number
14
Pages (from-to)
2290-2299
Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Abstract

Prognostic monitoring of power quad flat no-lead (PQFN) packages with four distinct silver pastes, each varying in material composition (pure-Ag and resin-reinforced hybridAg) and sintering processes (pressure-assisted and pressureless), was investigated in this study. The PQFN packages with silver sintered die-attach materials were subjected to thermal cycling tests (?55 ° C to 150 ° C), and the performance degradation was evaluated based on the following metrics: 1) electrical ON-state resistance RDSon monitored periodically at specific thermal cycling intervals and 2) transient thermal impedance Zth(t = 0.1 s) monitored online during thermal cycling. These measurements were further validated using acoustic microscopy imaging and cross-sectional inspection. The pressureless Ag-sintering material demonstrated comparable performance to pressure-assisted Agsintering, with a dense microstructure, and consistent electrical and stable thermal performance. Whereas the pressureless resinreinforced hybrid-Ag material exhibited degradation with a relative increase of 33% in RDSon, 38% in Zth(t = 0.1 s), and 67% delamination of the die-attach interface over 1000 cycles. These findings suggest that pressureless Ag-sintering may offer a viable alternative to pressure-assisted methods for lead (Pb)- free die-attachments, while resin-reinforced hybrid-Ag requires further development for improved thermomechanical reliability..

Files

Prognostic_Monitoring_of_Power... (pdf)
(pdf | 12.3 Mb)
- Embargo expired in 14-02-2025
License info not available