This article introduces an online condition monitoring strategy that utilizes a transient heat pulse to detect package thermal performance degradation. The metric employed is the temperature-dependent transient thermal impedance "Zth(t, Tamb)."The proposed methodology offers quantitative insights into package thermal performance degradation and effectively pinpoints the presence of multiple failure mechanisms. A thermal test chip assembled in a power quad flat no-lead package is used in this study to demonstrate the methodology. The packaged devices are first characterized to determine the transient pulse duration, a critical parameter to monitor a specific region of interest. Subsequently, package thermal performance degradation is continuously monitored online during thermomechanical cycling lifetime experiments. The validity of the measurement results is later confirmed through acoustic imaging and cross-sectional analysis. The changes observed in Zth(t, Tamb) over thermal cycling correspond to the delamination of the active metal layers on the die and cohesive failure on the die attach. This article further includes a comparative summary, highlighting the distinctions between the proposed and industry-standard test methods. In conclusion, the importance of online condition monitoring to detect early signs of failure is emphasized, and the proposed methodology s practical applicability in real-life scenarios is briefly discussed.@en

With an increasing demand for high-power electronics, the need to meet stringent automotive norms and better understand the critical failure mechanisms are crucial in order to improve their reliablity. To that end, we developed an in-situ reliability monitoring setup capable of actively measuring the thermal performance of the package during lifetime testing. A Thermal Test Chip (TTC) assembled into a Power Quad Flat No-lead (PQFN) package was employed as a test vehicle for non-destructive reliability assessment. The TTC comprises resistive heaters as a heat source and resistive temperature elements for measuring the thermal response. The transient thermal behavior was evaluated based on the contribution of heat source to a temperature field, and the temperature distribution was measured at multiple spatial positions. The experimental results provide insights into the thermal properties’ influence on the thermal behavior of the package. A compact electro-thermal model based on analogies was developed to deconvolute and analyze the transient thermal measurements. The results of the compact model correlate with the experimental measurements, and the model’s accuracy was verified using finite element simulations. The development of such thermal characterization experiments and computationally inexpensive models assist in further understanding the impact of failures in advancing high-power density electronics.@en

Integrated Circuits and Electronic Modules experience concentrated thermal hot spots, which require advanced thermal solutions for effective distribution and dissipation of heat. The superior thermal properties of diamonds are long known, and it is an ideal material for heat-spreading applications. However, growing diamond films to the electronic substrate require complex processing at high temperatures. This research investigates a heterogeneous method of integrating diamond heat spreaders during the back-end packaging process. The semiconductor substrate and the heat spreader thicknesses were optimized based on simulations to realize a thermally enhanced Power Quad-Flat No-Lead package. The performance of the thermally enhanced PQFN was assessed by monitoring the temperature distribution across the active device surface and compared to a standard PQFN (without a heat spreader). Firstly, the thermally enhanced PQFN indicated a 9.6% reduction in junction temperature for an input power of 6.6W with a reduced thermal gradient on the active device surface. Furthermore, the diamond heat spreader's efficiency was observed to increase with increasing power input. Besides, the reliability of the thermally enhanced PQFN was tested by thermal cycling from -55°C to 150°C, which resulted in less than 2% thermal degradation over two-hundred cycles. Such choreographed thermal solutions are proven to enhance the packaged device's performance, and the superior thermal properties of the diamond are beneficial to suffice the increasing demand for high power. @en

Resin-reinforced silver (Ag) sintering material is an effective and highly reliable solution for power electronics packaging. The hybrid material’s process parameters strongly influence its microstructure and pose a significant challenge in estimating its effective properties as a thin interconnect layer. This research demonstrates a novel 3D reconstruction methodology for the microstructural investigation of the resin-reinforced Ag sintering material from OverMolded Plastic (OMP) packages. Based on the reconstructed models with different sintering parameters (temperature and time), the fraction of Ag and Resin volume distribution, the connectivity of silver particles, and the tortuosity factors were estimated. A 99% connectivity of sintered Ag particles was achieved with various sintering conditions, such as 200°C for 2 hours, 200°C for 4 hours, and 250°C for 2 hours. However, coarsening of Ag particles was promoted when sintered at 250°C. Increasing the sintering time at 200°C had insignificant changes. The estimated tortuosity factor also indicated that sintering at 250°C provides the shortest heat transport path between the semiconductor die and the package substrate. In order to quantify the microstructural findings, the OMP packages’ thermal performance with different sintering conditions (temperature, time, and interconnect thickness) was experimentally assessed. Although the experimental measurements were less sensitive to the effective interface thermal resistances’, the measurement results show a good correlation with the microstructural analysis. Sintering the Resin-reinforced Ag sintering material at higher temperatures (250°C) seems to improve the package thermal performance, and increasing the sintering time at 200°C has a negligible effect.@en

This study introduces a training protocol utilizing Convolutional Neural Networks (CNNs) and Confocal Scanning Acoustic Microscopy (CSAM) imaging techniques to classify Power Quad Flat No-leads (PQFN) package delamination. The investigation involves empty PQFN packages with varied substrate metallizations subjected to thermal cycling. Four delamination classes were labeled: Die-pad delamination (Class-A), Bond-pad delamination (Class-B), both Die-pad and Bond-pad delamination (Class-C), and No delamination (Class-D). Due to data imbalance, additional randomness was introduced for distribution balancing. Residual Networks (ResNet-18) based CNN model was selected for classification. Five-fold cross-validation assessed overfitting performance concerning input data size, image resolution, and batch size. The ResNet-18 prediction performance was evaluated using precision and recall metrics, with the model achieving average precision and recall scores of 0.86/1 and 0.83/1, respectively. Additionally, a comparison of delamination among different substrate metallizations was presented with Ag and NiPdAu indicating significant delamination compared to bare Cu substrate. This study pioneers the integration of CNNs with CSAM imaging for package defect detection and classification, laying the groundwork for future research to address the complex interplay of multiple failure mechanisms in functional packages.@en