DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs
Guilherme Cardoso Medeiros (TU Delft - Electrical Engineering, Mathematics and Computer Science)
Mottaqiallah Taouil (TU Delft - Electrical Engineering, Mathematics and Computer Science)
Moritz Fieback (TU Delft - Electrical Engineering, Mathematics and Computer Science)
L. M. Bolzani Poehls (Pontifical Catholic University of Rio Grande do Sul)
Said Hamdioui (TU Delft - Electrical Engineering, Mathematics and Computer Science)
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Abstract
Hard-to-detect faults such as weak and random faults in FinFET SRAMs represent an important challenge for manufacturing testing in scaled technologies, as they may lead to test escapes. This paper proposes a Design-for-Testability (DFT) scheme able to detect such faults by monitoring the bitline swing of FinFET memories. Using only five operations per cell, we are able to detect defects that cause deterministic, random, and weak faults. Compared to the state of the art, this leads to an improved detection capability at reduced area overhead.