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Doubling of sensitivity and bandwidth in phonon cooled hot electron bolometer mixers
Doubling of sensitivity and bandwidth in phonon cooled hot electron bolometer mixers
Resistance of superconducting nanowires connected to normal-metal leads
Resistance of superconducting nanowires connected to normal-metal leads
Group-theoretical analysis of double acceptors in a magnetic field: Identification of the Si:B+ ground state
Group-theoretical analysis of double acceptors in a magnetic field: Identification of the Si:B+ ground state
Competition between spin-orbit interaction and Zeeman coupling in Rashba two-dimensional electron gases
Competition between spin-orbit interaction and Zeeman coupling in Rashba two-dimensional electron gases
Magnetic-Field Dependence of the Anomalous Noise Behavior in a Two-Dimensional Electron System in Silicon
Magnetic-Field Dependence of the Anomalous Noise Behavior in a Two-Dimensional Electron System in Silicon
Stark effect in shallow impurities in Si
Stark effect in shallow impurities in Si
Conductance distribution in nanometer-sized semiconductor devices due to dopant statistics
Conductance distribution in nanometer-sized semiconductor devices due to dopant statistics
Direct observation by resonant tunneling of the B+ level in a o-doped silicon barrier
Direct observation by resonant tunneling of the B+ level in a o-doped silicon barrier
Statistical significance of the fine structure in the frequency spectrum of Aharonov-Bohm conductance oscillations
Statistical significance of the fine structure in the frequency spectrum of Aharonov-Bohm conductance oscillations
Field-effect transistors on tetracene single crystals
Field-effect transistors on tetracene single crystals
Scaling behavior and parasitic series resistance in disordered organic field-effect transistors
Scaling behavior and parasitic series resistance in disordered organic field-effect transistors
Gate-induced ionization of single dopant atoms
Gate-induced ionization of single dopant atoms
Texture-related roughness of (Nb,Ti)N sputter-deposited films
Texture-related roughness of (Nb,Ti)N sputter-deposited films
Analysis of the fabrication process of Nb/Al-AlN/sub x//Nb tunnel junctions with low R/sub n/A values for SIS mixers
Analysis of the fabrication process of Nb/Al-AlN/sub x//Nb tunnel junctions with low R/sub n/A values for SIS mixers
Single domain transport measurements of C60 films
Single domain transport measurements of C60 films
Coherent Backscattering near the Two-Dimensional Metal-Insulator Transition
Coherent Backscattering near the Two-Dimensional Metal-Insulator Transition
In-plane magnetoconductivity of Si MOSFETs: A quantitative comparison of theory and experiment
In-plane magnetoconductivity of Si MOSFETs: A quantitative comparison of theory and experiment
Spin-Independent Origin of the Strongly Enhanced Effective Mass in a Dilute 2D Electron System
Spin-Independent Origin of the Strongly Enhanced Effective Mass in a Dilute 2D Electron System
Scaling of nano-Schottky-diodes
Scaling of nano-Schottky-diodes
Switch-on voltage in disordered organic field-effect transistors
Switch-on voltage in disordered organic field-effect transistors
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