AM
A.R. Mohammad Zaki
8 records found
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Accurate registration of weak charge signals with a high event rate is the most challenging requirement of state-of-the-art detector readout frontends. This has given rise to the development of a wide variety of low-noise power-efficient readout frontends with a trend in achievin
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State-of-the-art readout integrated circuits (ROICs) operating in particle-counting mode are tending toward high time resolution in the nanosecond range, low-noise for accurate detection of lower-energy particles, and low-power consumption allowing the use of multiple channels on
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This paper presents the design methodology, test setup and experimental qualification results of a high-speed low-power threshold comparator in 40 nm CMOS technology intended for the registry of particles landing on a PIN-detector surface in particle detector readout electronics.
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Small charge detection is used for a wide range of applications: advanced industrial process control, experimental physics and space instruments, and material testing and medical imaging. These applications give rise to the development of a wide variety of charge-sensitive readou
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State-of-the-art readout integrated circuits (ROICs) operating in particle-counting mode are gravitating toward high time resolution, low-noise, and low-power analog readout frontends to detect and register the arrival time of charge signals with a high accuracy. To achieve a tim
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This article presents the experimentally characterized performance of a low noise and wideband sensor readout integrated circuit (ROIC). The ROIC is designed to detect small amounts of charge generated by a silicon p-i-n detector as a result of particle detection, with very high
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Particle detection circuits are used for a wide range of applications from experimental physics to material testing and medical imaging. In the state-of-The-Art systems, the trend is to design low-noise and low-power readout front-end electronics with a low detection error rate a
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Particle detection circuits are used for a wide range of applications from experimental physics to material testing and medical imaging. State-of-the-art imaging systems, such as scanning electron microscopes (SEMs), demand the ability to detect small amounts of charge with small
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