In this paper, the enabling of the standard configuration of the mm-Wave VNA to perform Over-The-Air antenna characterization is presented. The measurement setup proposed allows to fully characterizing the different type of on-chip antennas thank the vector power calibration and the phase calibration. In fact, using the power calibration, the setup allows measuring the absolute value of the power at the calibration reference planes directly using the VNA’s receivers. Adding the phase calibration to the calibration procedure enables the measurement setup to provide two phase-coherent sources (at port1 and port2) allowing the characterization of a combining active fed on-chip antenna. Measurements of a stand-alone antenna from 220 to 500 GHz and of a combining active fed on-chip antenna among the frequency (from 130 to 155 GHz) and among the relative phase variation (from 0 to 70 degrees) are presented. The measurement results, in the first case, show a very good agreement with simulation while, in the second case, show the capability of the setup to control the relative phase of its two ports.@en

In this contribution we present a custom test-bench capable of delivering multi-path mm-wave signals with amplitude and phase control to an on-wafer environment. The setup employs direct IQ up-conversion in the 7.5GHz to 10GHz band, with high resolution DACs to modulate both amplitude and phases of n coherent LO signals. Signal amplification followed by frequency multiplication generates mm-wave signals in the 30 to 40GHz range. An amplitude pre-distortion technique, to level the IQ mixer output power versus phase angle, and a calibration technique are developed to achieve accurate amplitude and phase control between the signals at the wafer probe-tip level.@en