HP

Hugo Perez Garza

17 records found

Authored

Any dielectric material under a strain gradient presents flexoelectricity. Here, we synthesized 0.75 sodium bismuth titanate −0.25 strontium titanate (NBT-25ST) core–shell nanoparticles via a solid-state chemical reaction directly inside a transmission electron microscope (TEM ...

The choice on which type of cantilever to use for Atomic Force Microscopy (AFM) depends on the type of the experiment being done. Typically, the cantilever has to be exchanged when a different stiffness is required and the entire alignment has to be repeated. In the present work, ...

In situ stiffness adjustment in microelectromechanical systems is used in a variety of applications such as radio-frequency mechanical filters, energy harvesters, atomic force microscopy, vibration detection sensors. In this review we provide designers with an overview of exis ...

Contributed

Electron microscopy has enabled us to visualize objects that are not observable with a light microscope. With Transmission electron microscope observation up to subatomic level is possible. Generally, the sample is under vacuum in an electron microscope. But in real life sample i ...
Transmission electron microscopy is a powerful and commonly used tool to study nanoparticles, nanowires and 2D materials. It provides static information from the sample with atomic resolution, in high vacuum and at ambient temperature. However, in real processes, the environment ...