Understand the Physics of Solder Joint Degradation in Board Level Reliability Vibration and Thermal Cycle Test

Master thesis (2023)

Authors

L. Zhang Electrical Engineering, Mathematics and Computer Science

Contributors

Kouchi Zhang Electronic Components, Technology and Materials - EEMCS (supervisor 1)
W.D. van Driel Electronic Components, Technology and Materials - EEMCS (supervisor 1)
V. Thukral Electronic Components, Technology and Materials - EEMCS (supervisor 1)
A.S. Inamdar Electronic Components, Technology and Materials - EEMCS (supervisor 1)
A. Shekhar DC systems, Energy conversion & Storage - EEMCS (supervisor 2)
H.W. van Zeijl Electronic Components, Technology and Materials - EEMCS (supervisor 2)
Faculty
Electrical Engineering, Mathematics and Computer Science
Copyright: © 2023 Letian Zhang
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Published Date

25-08-2023

Language

English

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Faculty

Electrical Engineering, Mathematics and Computer Science

Abstract

Board-level reliability (BLR) looks at the reliability problem in the package and PCB interconnection, which is an important topic in microelectronics. The current criterion in the BLR test is to look if the connection is open, which can only detect the failure and there is no available method that can detect the degradation of the solder joints. This project mainly focuses on the degradation process of solder joints in board-level vibration tests and thermal cycle tests.

Special methods and test programs are developed tailored for two test vehicles, and some of the test results are collected and analyzed. Assisted by the failure analysis technique, the physical change of solder joints can be observed.

Findings in this study show the parameter shift during the solder joint degradation and also the mathematic model that describes the relationship between the crack of the solder joints and resistance increment.