RRAM-based compute-in-memory (CIM) AI accelerators integrate memory cells with mixed-signal peripherals to enable energy-efficient, low-latency edge computing. These architectures require novel test techniques for unique electrical defects. Current system-level functional tests cannot guarantee defect-free circuits, while accurate circuit-level techniques remain non-scalable to Deep Neural Networks (DNNs). To bridge this gap, we present the first structural test methodology for CIM DNNs, unifying system-level analysis with circuit-level precision. We accurately model RRAM crossbar defects to formulate test patterns, and then propagate results across layers for comprehensive structural testing. Generated test patterns are optimized either for 96% defect coverage or test time reduction by a factor of three while covering all unique defects and maintaining over 73% defect strength coverage.

Computing-in-Memory (CIM) architectures using memristive crossbar arrays enable energy-efficient AI acceleration. Analog non-idealities, such as IR drop and nonlinearity, impose design constraints that existing simulators cannot capture and thus explore effectively. Current approaches sacrifice either modeling accuracy or simulation speed, preventing systematic design space exploration. In this paper we propose X-Sim, a crossbar simulator that resolves this trade-off through a modular architecture. Our approach decouples device physics from circuit analysis using a fixed-point scheme, avoiding expensive Jacobian computations while preserving device fidelity. X-Sim delivers SPICE-level accuracy (< 1% error) with up to 200× speedup over physics-based simulators. This enables quick and systematic design space exploration across thousands of configurations, guiding reliable system design. X-Sim will be released as open source.

Although offering great potential for energy-efficient edge-AI, memristor-based CIM accelerators are severely hindered by IR drop induced errors. To tackle this, we propose a low-cost mitigation technique by first quantifying the impact of IR drop on the accuracy. Then, a mitigation strategy is developed to compensate for IR drop-induced inference accuracy reduction by combining an optimized mapping scheme with a fine-tuned calibration of the ADC. Results show the proposed solution can effectively mitigate IR drop with a negligible overhead.