In this article, we present an analytical formulation based on an equivalent circuit model to support the challenging task of designing and analyzing single-ended patch sensing elements to be integrated in planar technologies. The proposed approach further allows for differentiating the permittivity values of the individual layers when sensing over dense and stratified mediums. The equivalent model of the sensing pixel is derived resorting to equivalence theorem and transmission-line theory. The relative impact of the material under test and the metal thickness of the sensing element is accurately included in the evaluation of the endpoint load of the radial transmission line, equivalent to the patch radius. This approach of representing the single-ended sensing element isolates the capacitance contributions associated with the patch radius, patch thickness, and the medium under test. The computationally fast tool is further utilized in absolute permittivity measurements using a 0.14- μm CMOS 2-D permittivity imaging matrix prototype operating from 100 MHz to 2.9 GHz, reporting excellent agreement with theoretical values.

We present a compact, scalable, and broadband architecture for the implementation of complex microwave permittivity sensors in complementary metal-oxide semiconductor (CMOS) technology. The proposed architecture consists of a patch sensor embedded in a programmable balanced readout bridge and performs third and fifth harmonic downconversion for fast multi-frequency readout. Circuits designed can act as the basic building block for a wide span of biomedical applications, ranging from wearables to permittivity imaging. Experimental results of manufactured prototypes demonstrate measurement noise reduction through bridge balancing, Debye model parameter estimation of independent material with a 1.6% error using full frequency dataset, and 5.3% in high energy efficiency mode, as well as image construction based on material permittivity differences.

In this paper, we present a technique to extract the complex permittivity of the different layers (i.e., pulp and skin) of a biological sample (i.e., mangoes) in broadband dielectric spectroscopy measurements. The proposed approach is based on a newly developed accurate and rapid electromagnetic lumped capacitance equivalent network model for the open-ended coaxial cable, capable of accounting for stratified layered media. Combining broadband dielectric measurement with the model predictions allows to derive the permittivity of the internal layers of the biological sample. The proposed approach is applied to evaluate fruit quality, i.e., staging of the effective fruit ripening and identification of internal fruit defects (not visible externally). Broadband permittivity measurements (0.5GHz to 5GHz) are presented and combined with the EM model to demonstrate the effectiveness of the technique for evaluation of the internal (i.e., pulp) staging and structure disorders in Mangoes.

This paper presents a 0.15×0.3 mm² complex permittivity sensor integrated in a 40-nm CMOS node. A single-ended patch, employed as a near-field sensing element, is integrated with a double-balanced, fully-differential tunable impedance bridge that is driven by a square RF pulse. The multi-harmonic, interme-diate-frequency down-conversion architecture achieves a compact form factor and fast multi-frequency readout. Measurement results show good agreement with theoretical values and the measured relative permittivity variation remains below 0.3 over a 0.1-10 GHz range at a 1-ms measurement time. The energy efficiency resulting from the fast measurement time and the record-small active area allows integration in battery-operated wearables.