Room-temperature sputtered tungsten-doped indium oxide for improved current in silicon heterojunction solar cells
Can Han (Shenzhen Institute of Wide-bandgap Semiconductors, TU Delft - Photovoltaic Materials and Devices)
Yifeng Zhao (TU Delft - Photovoltaic Materials and Devices)
Luana Mazzarella (TU Delft - Photovoltaic Materials and Devices)
Rudi Santbergen (TU Delft - Photovoltaic Materials and Devices)
Ana Montes (TU Delft - Photovoltaic Materials and Devices, Universidade de Lisboa)
Paul Moya (TU Delft - Photovoltaic Materials and Devices)
Guangtao Yang (TU Delft - Photovoltaic Materials and Devices)
Xiaodan Zhang (Nankai University)
Miro Zeman (TU Delft - Electrical Sustainable Energy)
Olindo Isabella (TU Delft - Photovoltaic Materials and Devices)
More Info
expand_more
Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.
Abstract
The window layers limit the performance of silicon heterojunction (SHJ) solar cells with front and back contacts. Here, we optimized tungsten-doped indium oxide (IWO) film deposited by radio frequency magnetron sputtering at room temperature. The opto-electrical properties of the IWO were manipulated when deposited on top of thin-film silicon layers. The optimal IWO on glass shows carrier density and mobility of 2.1 × 1020 cm−3 and 34 cm2 V−1s−1, respectively, which were tuned to 2.0 × 1020 cm−3 and 47 cm2 V−1s−1, as well as 1.9 × 1020 cm−3 and 42 cm2 V−1s−1, after treated on i/n/glass and i/p/glass substrates, respectively. Using the more realistic TCO data that were obtained on thin-film silicon stacks, optical simulation indicates a promising visible-to-near-infrared optical response in IWO-based SHJ device structure, which was demonstrated in fabricated devices. Additionally, by adding an additional magnesium fluoride layer on device, the champion IWO-based SHJ device showed an active area cell efficiency of 22.92%, which is an absolute 0.98% efficiency gain compared to the ITO counterpart, mainly due to its current gain of 1.48 mA/cm2.