The development of direct probes of entanglement is integral to the rapidly expanding field of complex quantum materials. Here we test the robustness of entangled neutrons as a quantum probe by measuring the Clauser-Horne-Shimony-Holt contextuality witness while varying the beam properties. Specifically, we show that the mode entanglement of the spin and path subsystems of individual neutrons prepared in two different experiments using two different apparatuses persists even after varying the entanglement length, coherence length, and neutron energy difference of the paths. The two independent apparatuses acting as entangler-disentangler pairs are static-field magnetic Wollaston prisms and resonance-field radio-frequency flippers. Our results show that the spatial and energy properties of the neutron beam may be significantly altered without reducing the contextuality witness value below the Tsirelson bound, meaning that maximum entanglement is preserved. We also show that two paths may be considered distinguishable even when the path states significantly overlap. Therefore, we have shown that our experimental results are consistent with the distinguishable subsystem assumption down to a separation of less than 100 nm, proving entanglement and the contextual nature of reality on short length scales. This work is the key step in the realization of the modular, robust technique of entangled neutron scattering, which can extract entanglement information from a sample without the knowledge of the microscopic sample Hamiltonian: only semiquantitative knowledge of the correlation lengths of the relevant degrees of freedom and the timescales of the characteristic dynamics is required.

This paper focuses on a new non-ideal phenomenon induced by the power supply crosstalk (PSC) of the row drive circuit in 8 T global shutter (GS) CMOS image sensors (CISs). A method to eliminate the non-ideal phenomenon is presented. Based on the circuit simulation, the relationship between the parasitic resistance and PSC is analyzed. The PSC would cause a charge leakage on the sampling hold (S/H) capacitors in the 8 T pixel, which in turn attenuates the output signal of the image sensor. Through the mathematical model of the in-pixel S/H circuit, the effect of PSC and exposure on signal attenuation is analyzed. To eliminate signal attenuation, this paper utilizes a separate power layout method that isolates the row drivers in different columns by using multiple power supplies. In contrast to the method of sharing the power supply, the proposed method can reduce the maximum power supply crosstalk noise from 1.17 V to 2.58 μV in the 2000 × 2 row drive array. Based on the 0.13 μm CMOS process, the measurement results of the 1st chip design using the typical shared power structure and the 2nd chip design using the separate power supply structure are compared. The measurement results show that the output signal of the 1st chip design is limited to about 303 ADU due to the power supply crosstalk. The saturated output signal of the 2nd chip design is 2200 ADU, which is in accordance with the theoretical signal output value (2200 ADU) when the pixel is saturated. The proposed method can effectively eliminate signal attenuation induced by the PSC, thereby improving the image quality of 8 T GS CIS.